Optical Inspection Of Microsystems

Author: Wolfgang Osten
Publisher: CRC Press
ISBN: 9781420019162
Size: 69.81 MB
Format: PDF
View: 3356
Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy. They also examine modern approaches to data acquisition and processing. The book emphasizes the evaluation of various properties to increase reliability and promote a consistent approach to optical testing. Numerous practical examples and illustrations reinforce the concepts. Supplying advanced tools for microsystem manufacturing and characterization, Optical Inspection of Microsystems enables you to reach toward a higher level of quality and reliability in modern micro-scale applications.

Ultrasonic Transducers

Author: K Nakamura
Publisher: Elsevier
ISBN: 0857096303
Size: 32.74 MB
Format: PDF, Docs
View: 2451
Ultrasonic transducers are key components in sensors for distance, flow and level measurement as well as in power, biomedical and other applications of ultrasound. Ultrasonic transducers reviews recent research in the design and application of this important technology. Part one provides an overview of materials and design of ultrasonic transducers. Piezoelectricity and basic configurations are explored in depth, along with electromagnetic acoustic transducers, and the use of ceramics, thin film and single crystals in ultrasonic transducers. Part two goes on to investigate modelling and characterisation, with performance modelling, electrical evaluation, laser Doppler vibrometry and optical visualisation all considered in detail. Applications of ultrasonic transducers are the focus of part three, beginning with a review of surface acoustic wave devices and air-borne ultrasound transducers, and going on to consider ultrasonic transducers for use at high temperature and in flaw detection systems, power, biomedical and micro-scale ultrasonics, therapeutic ultrasound devices, piezoelectric and fibre optic hydrophones, and ultrasonic motors are also described. With its distinguished editor and expert team of international contributors,Ultrasonic transducers is an authoritative review of key developments for engineers and materials scientists involved in this area of technology as well as in its applications in sectors as diverse as electronics, wireless communication and medical diagnostics. Reviews recent research in the design and application of ultrasonic transducers Provides an overview of the materials and design of ultrasonic transducers, with an in-depth exploration of piezoelectricity and basic configurations Investigates modelling and characterisation, applications of ultrasonic transducers, and ultrasonic transducers for use at high temperature and in flaw detection systems

Computational And Experimental Mechanics Of Advanced Materials

Author: Vadim V. Silberschmidt
Publisher: Springer Science & Business Media
ISBN: 3211996850
Size: 68.75 MB
Format: PDF, ePub, Mobi
View: 5519
Advanced materials play a crucial role in modern engineering applications where they are often exposed to complex loading and environmental conditions. In many cases, new approaches are needed to characterise these materials and to model their behaviour. Such approaches should be calibrated and validated by specific experimental techniques, quantifying both microstructural features and respective mechanisms at various length scales. The book provides an overview of modern modelling tools and experimental methods that can be employed to analyse and estimate properties and performance of advanced materials. A special feature of the book is the analysis of case studies used to demonstrate the strategies of solving the real-life problems, in which the microstructure of materials directly affects their response to loading and/or environmental conditions. The reader will benefit from a detailed analysis of various methods as well as their implementation for dealing with various advanced materials.

Coherent Light Microscopy

Author: Pietro Ferraro
Publisher: Springer Science & Business Media
ISBN: 9783642158131
Size: 61.71 MB
Format: PDF, ePub, Mobi
View: 2164
This book deals with the latest achievements in the field of optical coherent microscopy. While many other books exist on microscopy and imaging, this book provides a unique resource dedicated solely to this subject. Similarly, many books describe applications of holography, interferometry and speckle to metrology but do not focus on their use for microscopy. The coherent light microscopy reference provided here does not focus on the experimental mechanics of such techniques but instead is meant to provide a users manual to illustrate the strengths and capabilities of developing techniques. The areas of application of this technique are in biomedicine, medicine, life sciences, nanotechnology and materials sciences.

Introduction To Optical Metrology

Author: Rajpal S. Sirohi
Publisher: CRC Press
ISBN: 1482236117
Size: 29.95 MB
Format: PDF, ePub, Mobi
View: 2572
Introduction to Optical Metrology examines the theory and practice of various measurement methodologies utilizing the wave nature of light. The book begins by introducing the subject of optics, and then addresses the propagation of laser beams through free space and optical systems. After explaining how a Gaussian beam propagates, how to set up a collimator to get a collimated beam for experimentation, and how to detect and record optical signals, the text: Discusses interferometry, speckle metrology, moiré phenomenon, photoelasticity, and microscopy Describes the different principles used to measure the refractive indices of solids, liquids, and gases Presents methods for measuring curvature, focal length, angle, thickness, velocity, pressure, and length Details techniques for optical testing as well as for making fiber optic- and MEMS-based measurements Depicts a wave propagating in the positive z-direction by ei(ωt – kz), as opposed to ei(kz – ωt) Featuring exercise problems at the end of each chapter, Introduction to Optical Metrology provides an applied understanding of essential optical measurement concepts, techniques, and procedures.

Interferogram Analysis For Optical Testing

Author: Daniel Malacara
Publisher: CRC Press
ISBN: 9780824799403
Size: 21.66 MB
Format: PDF, Mobi
View: 552
"Lays out the fundamentals of, as well as computational methods for, studying fringe patterns produced by optical testing interferometers--providing beginners with the necessary background to enter this field and helping seasoned researchers to refine current analytical approaches. Discusses classical and state-of-the-art fringe analysis techniques with exceptional clarity."

Laser Diode Microsystems

Author: Hans Zappe
Publisher: Springer Science & Business Media
ISBN: 9783540404545
Size: 15.13 MB
Format: PDF
View: 2403
Laser Diode Microsystems provides the reader with the basic knowledge and understanding required for using semiconductor laser diodes in optical microsystems and micro-optical electromechanic systems. This tutorial addresses the fundamentals of semiconductor laser operation and design, coupled with an overview of the types of laser diodes suitable for use in Microsystems, along with their distinguishing characteristics. Emphasis is placed on laser diode characterization and measurement as well as the assembly techniques and optical accessories required for incorporation of semiconductor lasers into complex microsystems. Equipped with typical results and calculation examples, this hand-on text helps readers to develop a feel for how to choose a laser diode, characterize it and incorporate it into a microsystem.

Optical Sensors And Microsystems

Author: S. Martellucci
Publisher: Springer Science & Business Media
ISBN: 0306470993
Size: 48.97 MB
Format: PDF, Mobi
View: 1796
Proceedings of the 22nd Course of the International School of Quantum Electronics, held 27 November-2 December 1997, in Erice, Italy. In recent years, fiber optical sensors and optical microsystems have assumed a significant role in sensing and measurement of many kinds. These optical techniques are utilised in a wide range of fields, including biomedicine, environmental sensing, mechanical and industrial measurement, and art preservation. This volume, an up-to-date survey of optical sensors and optical microsystems, aims at combining a tutorial foundation with analysis of current research in this area, and an extensive coverage of both technology and applications.

Interferogram Analysis For Optical Testing Second Edition

Author: Zacarias Malacara
Publisher: CRC Press
ISBN: 9781420027273
Size: 60.92 MB
Format: PDF, ePub
View: 587
In this day of digitalization, you can work within the technology of optics without having to fully understand the science behind it. However, for those who wish to master the science, rather than merely be its servant, it's essential to learn the nuances, such as those involved with studying fringe patterns produced by optical testing interferometers. When Interferogram Analysis for Optical Testing originally came to print, it filled the need for an authoritative reference on this aspect of fringe analysis. That it was also exceptionally current and highly accessible made its arrival even more relevant. Of course, any book on something as cutting edge as interferogram analysis, no matter how insightful, isn't going to stay relevant forever. The second edition of Interferogram Analysis for Optical Testing is designed to meet the needs of all those involved or wanting to become involved in this area of advanced optical engineering. For those new to the science, it provides the necessary fundamentals, including basic computational methods for studying fringe patterns. For those with deeper experience, it fills in the gaps and adds the information necessary to complete and update one's education. Written by the most experienced researchers in optical testing, this text discusses classical and innovative fringe analysis, principles of Fourier theory, digital image filtering, phase detection algorithms, and aspheric wavelength testing. It also explains how to assess wavefront deformation by calculating slope and local average curvature.


Author: M. Edward Motamedi
Publisher: SPIE Press
ISBN: 9780819450210
Size: 22.47 MB
Format: PDF, Mobi
View: 7411
This is a great compendium of fundamentals, research, and applications in the rapidly growing area of optical microsystems. Every engineer working on MOEMS should have this on his or her bookshelf. --Douglas R. Sparks, Ph.D., Executive Vice President, Integrated Sensing Systems Inc. (ISSYS) This book introduces the exciting and fast-moving field of MOEMS to graduate students, scientists, and engineers by providing a foundation of both micro-optics and MEMS that will enable them to conduct future research in the field. Born from the relatively new fields of MEMS and micro-optics, MOEMS are proving to be an attractive and low-cost solution to a range of device problems requiring high optical functionality and high optical performance. MOEMS solutions include optical devices for telecommunication, sensing, and mobile systems such as v-grooves, gratings, shutters, scanners, filters, micromirrors, switches, alignment aids, lens arrays, and hermetic wafer-scale optical packaging. An international team of leading researchers contributed to this book, and it presents examples and problems employing cutting-edge MOEM devices. It will inspire researchers to further advance the design, fabrication, and analysis of MOEM systems.