Fault Tolerance Techniques For Sram Based Fpgas

Author: Fernanda Lima Kastensmidt
Publisher: Springer Science & Business Media
ISBN: 038731069X
Size: 15.19 MB
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This book reviews fault-tolerance techniques for SRAM-based Field Programmable Gate Arrays (FPGAs), outlining many methods for designing fault tolerance systems. Some of these are based on new fault-tolerant architecture, and others on protecting the high-level hardware description before synthesis in the FPGA. The text helps the reader choose the best techniques project-by-project, and to compare fault tolerant techniques for programmable logic applications.

Fpgas And Parallel Architectures For Aerospace Applications

Author: Fernanda Kastensmidt
Publisher: Springer
ISBN: 3319143522
Size: 39.91 MB
Format: PDF, Mobi
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This book introduces the concepts of soft errors in FPGAs, as well as the motivation for using commercial, off-the-shelf (COTS) FPGAs in mission-critical and remote applications, such as aerospace. The authors describe the effects of radiation in FPGAs, present a large set of soft-error mitigation techniques that can be applied in these circuits, as well as methods for qualifying these circuits under radiation. Coverage includes radiation effects in FPGAs, fault-tolerant techniques for FPGAs, use of COTS FPGAs in aerospace applications, experimental data of FPGAs under radiation, FPGA embedded processors under radiation and fault injection in FPGAs. Since dedicated parallel processing architectures such as GPUs have become more desirable in aerospace applications due to high computational power, GPU analysis under radiation is also discussed.

Digital Timing Measurements

Author: Wolfgang Maichen
Publisher: Springer Science & Business Media
ISBN: 0387314199
Size: 18.47 MB
Format: PDF, Kindle
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As many circuits and applications now enter the Gigahertz frequency range, accurate digital timing measurements have become crucial in the design, verification, characterization, and application of electronic circuits. To be successful in this field an engineer needs to understand instrumentation, measurement techniques, signal integrity, jitter and timing concepts, and statistics. This book gives a compact, practice-oriented overview on all these subjects with emphasis on useable concepts and real-life guidelines.

Cmos Sram Circuit Design And Parametric Test In Nano Scaled Technologies

Author: Andrei Pavlov
Publisher: Springer Science & Business Media
ISBN: 1402083637
Size: 69.21 MB
Format: PDF, Mobi
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The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

Oscillation Based Test In Mixed Signal Circuits

Author: Gloria Huertas Sánchez
Publisher: Springer Science & Business Media
ISBN: 1402053150
Size: 18.82 MB
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This book presents the development and experimental validation of the structural test strategy called Oscillation-Based Test – OBT in short. The results presented here assert, not only from a theoretical point of view, but also based on a wide experimental support, that OBT is an efficient defect-oriented test solution, complementing the existing functional test techniques for mixed-signal circuits.

Soft Errors In Modern Electronic Systems

Author: Michael Nicolaidis
Publisher: Springer Science & Business Media
ISBN: 9781441969934
Size: 39.17 MB
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This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques. The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Architecture And Cad For Deep Submicron Fpgas

Author: Vaughn Betz
Publisher: Springer Science & Business Media
ISBN: 1461551455
Size: 27.24 MB
Format: PDF, ePub, Mobi
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Since their introduction in 1984, Field-Programmable Gate Arrays (FPGAs) have become one of the most popular implementation media for digital circuits and have grown into a $2 billion per year industry. As process geometries have shrunk into the deep-submicron region, the logic capacity of FPGAs has greatly increased, making FPGAs a viable implementation alternative for larger and larger designs. To make the best use of these new deep-submicron processes, one must re-design one's FPGAs and Computer- Aided Design (CAD) tools. Architecture and CAD for Deep-Submicron FPGAs addresses several key issues in the design of high-performance FPGA architectures and CAD tools, with particular emphasis on issues that are important for FPGAs implemented in deep-submicron processes. Three factors combine to determine the performance of an FPGA: the quality of the CAD tools used to map circuits into the FPGA, the quality of the FPGA architecture, and the electrical (i.e. transistor-level) design of the FPGA. Architecture and CAD for Deep-Submicron FPGAs examines all three of these issues in concert. In order to investigate the quality of different FPGA architectures, one needs CAD tools capable of automatically implementing circuits in each FPGA architecture of interest. Once a circuit has been implemented in an FPGA architecture, one next needs accurate area and delay models to evaluate the quality (speed achieved, area required) of the circuit implementation in the FPGA architecture under test. This book therefore has three major foci: the development of a high-quality and highly flexible CAD infrastructure, the creation of accurate area and delay models for FPGAs, and the study of several important FPGA architectural issues. Architecture and CAD for Deep-Submicron FPGAs is an essential reference for researchers, professionals and students interested in FPGAs.

Digital Logic Testing And Simulation

Author: Alexander Miczo
Publisher: John Wiley & Sons
ISBN: 9780471457770
Size: 41.86 MB
Format: PDF, ePub
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Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

System On Chip Test Architectures

Author: Laung-Terng Wang
Publisher: Morgan Kaufmann
ISBN: 9780080556802
Size: 22.62 MB
Format: PDF, Kindle
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Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.